?url_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Adc&rft.relation=http%3A%2F%2Fmiis.maths.ox.ac.uk%2Fmiis%2F189%2F&rft.title=Methods+to+Localize+Shorts+Between+Power+and+Ground+Circuits&rft.creator=Santosa%2C+Fadil&rft.subject=Information+and+communication+technology&rft.description=In+the+competitive+world+of+microprocessor+design+and+manufacturing%2C+rapid+advancements+can+be+facilitated+by+learning+from+the+components+made+by+one%E2%80%99s+closest+rivals.+To+make+this+possible%2C+Orisar+Inc.+(formerly+Semiconductor+Insights)+provides+reverse+engineering+services+to+integrated+circuit+(IC)+manufacturers.+The+process+produces+a+circuit+diagram+from+a+chip+and+allows+the+manufacturer+to+learn+about+a+competitor%E2%80%99s+product.+These+services+are+also+used+to+determine+if+any+intellectual+property+infringements+have+been+committed+by+their+competitor.%0A%0AReverse+engineering+of+integrated+circuit+is+made+difficult+by+the+shrinking+form+factor+and+increasing+transistor+density.+To+perform+this+complex+task+Orisar+Inc.+employs+sophisticated+techniques+to+capture+the+design+of+an+IC.+Electron+microscope+photography+captures+a+detailed+image+of+an+IC+layer.+Because+a+typical+IC+contains+more+than+one+layer%2C+each+layer+is+photographed+and+physically+removed+from+the+IC+to+expose+the+next+layer.+A+noise+removal+algorithm+is+then+applied+to+the+pictures%2C+which+are+then+passed+to+pattern+recognition+software+in+order+to+transfer+the+layer+design+into+a+polygonal%0Arepresentation+of+the+circuit.+At+the+last+step+a+knowledgeable+human+expert+looks+at+the+polygonal+representation+and+inputs+the+design+into+a+standard+electronic+schematic+with+a+CAD+package.%0A%0AThis+process+us+currently+very+time+consuming.+We+propose+a+method+which+can+be+easily+automated+thereby+saving+valuable+worker+time+and+accelerating+the+process+of+reverse+engineering.&rft.date=2003&rft.type=Study+Group+Report&rft.type=NonPeerReviewed&rft.format=application%2Fpdf&rft.language=en&rft.identifier=http%3A%2F%2Fmiis.maths.ox.ac.uk%2Fmiis%2F189%2F1%2Forisar.pdf&rft.identifier=++Santosa%2C+Fadil++(2003)+Methods+to+Localize+Shorts+Between+Power+and+Ground+Circuits.++%5BStudy+Group+Report%5D+++++